ISJ Theoretical & Applied Science 10(102) 2021

Philadelphia, USA

Ashurov, J. M., Khojiev, Sh. T., Qosimov, I. O., Gaibnazarov, B. B., & Teshayev, M. Sh.

Study of the physico-chemical properties of aluminum oxide al2o3 by the method of powder diffractometry.

Full Article: PDF

Scientific Object Identifier: http://s-o-i.org/1.1/TAS-10-102-9

DOI: https://dx.doi.org/10.15863/TAS.2021.10.102.9

Language: English

Citation: Ashurov, J. M., Khojiev, Sh. T., Qosimov, I. O., Gaibnazarov, B. B., & Teshayev, M. Sh. (2021). Study of the physico-chemical properties of aluminum oxide al2o3 by the method of powder diffractometry. ISJ Theoretical & Applied Science, 10 (102), 179-183. Soi: http://s-o-i.org/1.1/TAS-10-102-9 Doi: https://dx.doi.org/10.15863/TAS.2021.10.102.9

Pages: 179-183

Published: 30.10.2021

Abstract: X-ray diffraction analysis of materials is a standard method for phase identification and character-ization of polycrystalline materials [1]. Experimentally, various peaks were detected in the X-ray phase analysis (XRD) spectra of aluminum oxide Al2O3 sample. Based on the data (XRD) of samples of alumi-num oxide Al2O3 obtained for samples with different modes of powder production, Miller indices and lat-tice parameters were determined. The experimental data obtained are in good agreement with the data ob-tained by other methods.

Key words: aluminum oxide, powder, wide-gap semiconductor, Miller indices, microstructure.